Reliability Monitoring

Sample Selection Criteria for Periodic Reliability Testing:

Quarterly Reliability Testing
Quarterly Reliability Testing
Quarterly reliability tests are conducted on the device process technology platforms across different chip manufacturing facilities.
Selection of the Highest Volume Product
Selection of the Highest Volume Product
The product with the highest production volume within the device process technology platform during the quarter is selected for the quarterly reliability testing.

Periodic Reliability Test Program for Device Process Technology Platforms (Phase 1 + Phase 2)

PhaseTest ItemsTest Conditions

Sample Size
 (Quantity * Batches)

DurationAcceptance CriteriaRemarks
Phase1HTGBT=Tjmax, Vg=Follow qualification condition

77*1

168HStatic: Within datasheet specifications
Dynamic: Follow platform IOS or MP criteria
Test for the first 10 batches
• Static: 77 units/batch
• Dynamic: 8 sets/batch
HTRBT=Tjmax, Vd=Follow qualification condition

77*1

168H
Dynamic Rdson(DHTOL)Follow Qual. Condition or MP capability

8set*1

168H
Phase2HTGBT=Tjmax, Vg=Follow qualification condition

77*1

168HQuarterly Reliability Test
• Static: 77 units/batch
• Dynamic: 8 sets/batch
HTRBT=Tjmax, Vd=Follow qualification condition

77*1

168H
Dynamic Rdson(DHTOL)Follow Qual. Condition or MP capability

8set*1

168H
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