

Enhanced Reliability Standards
Beyond standard reliability certifications, the intrinsic robustness of the product is evaluated through multiple dimensions including high-volume ELFR testing, extended duration tests, and over-stress aging.
High-Volume ELFR Testing(ELFR)
| Items | Condition | Sample Size | Duration | #Fail |
|---|---|---|---|---|
| HTGB | Tjmax, Vgsmax | 800ea*3lots | 48H~168H | 0 Fail |
| HTRB | Tjmax, Vdsmax | 800ea*3lots | 48H~168H | 0 Fail |
Extended Reliability Testing
| Items | Test Condition | Standard Test Duration | INNO Extended Test Duration | #Fail |
|---|---|---|---|---|
| HTGB | Tjmax, Vgsmax, 1Lot*77ea | 1000H | 2000H | 0 Fail |
| HTRB | Tjmax, Vdsmax, 1Lot*77ea | 1000H | 2000H | 0 Fail |
| H3TRB | 85℃,85%RH,80%Vdsmax, 1Lot*77ea | 1000H | 2000H | 0 Fail |
Enhanced Reliability Testing (Over-Stress)
| Items | Test Condition | Standard Test Duration | #Fail |
|---|---|---|---|
| HTRB | T=15℃, >Vdsmax, 1Lot*77ea | 1000H | 0 Fail |
| H3TRB | 85℃,85%RH, Vdsmax, 1Lot*77ea | 1000H | 0 Fail |
Learn More About Our Reliability Management

Intrinsic Reliability Design, Lifetime Model & FITIntrinsic reliability design enables lifetime modeling and FIT calculation to evaluate long-term device reliability.Learn More
Reliability CertificationGaN reliability qualification ensures stable, long-term performance even in harsh operating environments.Learn More
Enhanced Reliability StandardsEnhanced reliability stress tests push devices to extreme conditions, combined with failure analysis to ensure exceptional durability and lifetime performance.Learn More
Reliability MonitoringContinuous reliability monitoring—supported by data collection and failure-prediction mechanisms—ensures long-term stability and performance consistency throughout device operation.Learn More