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Reliability Management
Built to Last – Redefining Safety and Reliability
Maintaining consistent safety even under extreme conditions.
To ensure long-term reliability and robustness, we incorporate high-standard protection mechanisms and lifetime model verification from the earliest stages of design. Through rigorous breakdown-voltage design and validation, we guarantee that every device meets safe lifetime requirements under demanding conditions.
Dynamic Reliability Testing
Covers dynamic on-resistance, current, and voltage stress testing to fully emulate real-world operating environments.
Transient Robustness Testing
UIS (Unclamped Inductive Switching) testing validates device robustness under extreme transient conditions.
High-Power & Thermal Reliability Testing
Includes short-circuit testing (Type I and Type II), repetitive short-circuit testing, and safe operating area (SOA) analysis—ensuring stability and safety under high-stress, high-power applications.
Intrinsic Reliability Design, Lifetime Model & FITIntrinsic reliability design enables lifetime modeling and FIT calculation to evaluate long-term device reliability.
Reliability CertificationGaN reliability qualification ensures stable, long-term performance even in harsh operating environments.
Enhanced Reliability StandardsEnhanced reliability stress tests push devices to extreme conditions, combined with failure analysis to ensure exceptional durability and lifetime performance.
Reliability MonitoringContinuous reliability monitoring—supported by data collection and failure-prediction mechanisms—ensures long-term stability and performance consistency throughout device operation.
