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40V Enhancement-mode GaN Enhancement-mode Power Transistor

GaN-on-Silicon enhancement mode high-electron-mobility-transistor (HEMT) in FCQFN with 3 mm x 4 mm package size.

Platform (S040E2.5)
Product (INN040FQ043A)
Test Items	Test Conditions	Sample Size (Unit x Lot)	#Fail	Result
MSL3	Ta=30°C, RH=60%, 3 x reflow, 192hrs	25 x 3	0 Fail	Pass
HTRB	Tj=150°C, VD=40V, 1000hrs	77 x 3	0 Fail	Pass
LTRB	Tj=-40°C, VD=32V, 1000hrs	77 x 3	0 Fail	Pass
HTGB(+)	Tj=150°C, VG=6.0V, 1000hrs	77 x 3	0 Fail	Pass
HTGB(-)	Tj=150°C, VG=-4.0V, 1000hrs	77 x 3	0 Fail	Pass
LTGB(+)	Tj=-40°C, VG=6.0V, 1000hrs	77 x 3	0 Fail	Pass
LTGB(-)	Tj=-40°C, VG=-4.0V, 1000hrs	77 x 3	0 Fail	Pass
TC	-40 to +125°C, Air, 1000Cys	77 x 3	0 Fail	Pass
H³TRB	Ta=85°C, RH=85%, VD=32V, 1000hrs	77 x 3	0 Fail	Pass
HAST	T=130℃, RH=85%, Vd=32V, 96hrs	77 x 3	0 Fail	Pass
uHAST	T=130℃, RH=85%, 96hrs	77 x 3	0 Fail	Pass
Solderability	Pre-Con: 8hrs Pb-free: 245±5°C, 5±0.5s	22 x 3	0 Fail	Pass
DHTOL	BUCK, Vin=32V, Vout=13.5V, Iout=10A, Fsw=1.2MHz, Tj=125°C, 1000hrs	22 x 3	0 Fail	Pass
HBM	All Pins	3 x 1	0 Fail	Class 1B
CDM	All Pins	3 x 1	0 Fail	Class 2a