1.1 Features
- GaN-on-Silicon E-mode HEMT technology
- Very low gate charge
- Ultra-low on Resistance
- Very small package size
- Zero reverse recovery charge
100V Enhancement-mode GaN Power Transistor
GaN-on-Silicon enhancement mode high-electron-mobility-transistor(HEMT) in Solder Bar WLCSP with 2.50mm x 1.50mm package size.
Innoscience’s E-mode GaNFETs were subjected to a variety of reliability test under the condition referenced to typical for silicon-based power MOSFETs.These test items and results were shown as below:
| Platform (S100E2.0) | ||||
|---|---|---|---|---|
| Product (INN100W070A) | ||||
| Test Items | Test Conditions | Sample Size (Unit x Lot) | #Fail | Result |
| MSL1 | T=85°C, RH=85%, 3 x reflow | 25 x 3 | 0 Fail | Pass |
| HTRB | T=150°C, VD=80V | 77 x 1 | 0 Fail | Pass |
| HTGB | T=150°C, VG=5.5V | 77 x 1 | 0 Fail | Pass |
| BLTC | -40 to +125°C | 77 x 1 | 0 Fail | Pass |
| H3TRB | T=85°C, RH=85%, VD=80V | 77 x 1 | 0 Fail | Pass |
| HAST | T=130°C, RH=85%, VD=42V | 77 x 1 | 0 Fail | Pass |
| HTSL | T=150°C | 77 x 1 | 0 Fail | Pass |
| HTOL | LLC, Vin=60V, Fsw=1MHz, Tj>125°C | 10 x 1 | 0 Fail | Pass |
| HBM | All Pins | 3 x 1 | 0 Fail | Class 1C |
| CDM | All Pins | 3 x 1 | 0 Fail | Class C2a |
| Parameter | Value |
|---|---|
| VDS,max | 100V |
| RDS(on),max @ VGS = 5 V | 7mΩ |
| QG,typ @ VDS = 50 V | 4.5nC |
| ID,pulse | 125A |
| QOSS @ VDS = 50 V | 25nC |