1.1 Features
- Bi-directional blocking capability
- GaN-on-Silicon E-mode HEMT technology
- Ultra-low on resistance
100V Bi-directional Enhancement-mode Power Transistor
Bi-directional GaN-on-Silicon enhancement mode high-electron-mobility-transistor (HEMT) in En-FCQFN with 4.0 mm x 6.0 mm package size.
Platform(V100E2.0I) | ||||
---|---|---|---|---|
Product (INV100EQ030A) | ||||
Test Items | Test Conditions | Sample Size (Unit x Lot) | #Fail | Result |
MSL3 | T=30°C, RH=60%, 3 x reflow,192hrs | 25 x 5 | 0 Fail | Pass |
PLTC | -55 to +150°C, Air, 1000Cys. | 77 x 5 | 0 Fail | Pass |
H3TRB | T=85°C, RH=85%, VD=80V/120V,1000hrs | 77 x 4 | 0 Fail | Pass |
HAST | T=130°C, RH=85%, VD=42V,96hrs | 77 x 4 | 0 Fail | Pass |
HTSL | T=150°C,1000hrs | 77 x 4 | 0 Fail | Pass |
Parameter | Value |
---|---|
VDD,max | 100V |
RDD(on),max @ VG = 5 V | 3.2mΩ |
QG,typ @ VDD = 50 V | 90nC |
ID,DC | 100A |
Qoss | 85nC |