产品

INN100EA035A

100V增强型GaN功率晶体管

1. 产品描述

基于先进GaN技术的100V硅基氮化镓增强型高电子迁移率晶体管,采用En-FCLGA 3.3 mm x 3.3mm 封装。

1.1 特性
  • 硅基GaN E型HEMT技术
  • 满足工业应用
  • 极低的栅极电荷
  • 超低导通电阻
  • 超小占板面积
1.2 应用市场
  • 高频DC-DC转换器
  • 高密度DC/DC电源模块
  • 同步整流
  • 电机驱动器
  • 太阳能系统MPPT

2. 可靠性测试

Platform (S100E3.0I)
 Product (INN100EA035A)
Test ItemsTest ConditionsSample Size (Unit x Lot)#FailResult
HTRB T=150°C, VD=100V, 1000hrs 77 x 3 0 Fail Pass
LTRB T=-40°C, VD=100V, 1000hrs 77 x 3 0 Fail Pass
HTGB T=150°C, VG=6V, 1000hrs 77 x 3 0 Fail Pass
HTGB- T=150°C, VG=-4V, 1000hrs 77 x 3 0 Fail Pass
LTGB T=-40°C, VG=6V, 1000hrs 77 x 3 0 Fail Pass
LTGB- T=-40°C, VG=-4V, 1000hrs 77 x 3 0 Fail Pass
ESD-HBM T=25°C, All pin 10 x 1 0 Fail Class 1B
ESD-CDM T=25°C, All pin 10 x 1 0 Fail Class C2a
DHTOL Hard switching, T=125°C, 100KHz, VD=80V, 1000hrs 8set x 1 0 Fail Pass
Hard switching, T=125°C, 600KHz, VD=80V, 1000hrs 8set x 2 0 Fail Pass
Soft Switching, T=125°C, 500KHz, VD=80V, 1000hrs 8set x 1 0 Fail Pass
Soft Switching, T=125°C, 1.5MHz, VD=80V, 1000hrs 8set x 2 0 Fail Pass
MSL3 T=30°C, RH=60%, 3 x reflow, 192hrs 25 x 3 0 Fail Pass
H3TRB T=85°C, RH=85%, VD=80V, 1000hrs 77 x 3 0 Fail Pass
PLTC -55 to +150°C, Air, 1000Cycles 77 x 3 0 Fail Pass
uHAST T=130°C, RH=85% 77 x 3 0 Fail Pass
IOL ΔTj ≥ 125℃; ton / toff = 1 min /5 min, 5000 Cycles 77 x 3 0 Fail Pass
RSH T=125°C bake 24hrs, T=30°C RH=60% soak 192hrs,   260±5℃, 10±1s 30 x 1 0 Fail Pass
Solderability Precondition Condition C (8hrs), Pb-free:245±5℃, 5±0.5s 10 x 1 0 Fail Pass

ParameterValue
VDS,max 100V
RDS(on),max @ VGS = 5 V 3.5mΩ
QG,typ @ VDS = 50 V 7.6nC
ID,pulse 230A
QOSS @ VDS = 50 V 42nC
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